These values fall between previously reported PLR of c-Si and thin-film modules. Our refined analysis leads us to slightly higher PLR for SHJ modules: 0.80%/year and 0.83%/year for median and average values, respectively. This methodology is understandably arbitrary, but it helps increasing the robustness of the present analysis. We then apply a filtering procedure to distinguish what we perceive to be high-accuracy datasets from less accurate ones.

These numbers are in line with PLR generally reported for field-deployed crystalline silicon (c-Si modules). Despite a long list of caveats specific to this type of meta-analysis, when considering all published datasets, we obtain for SHJ modules median and average PLR values of 0.56%/year and 0.70%/year, respectively. Publications on this specific subject are still limited however, enough available data exist to drive some preliminary conclusions. In this work, we perform a literature survey collecting performance data (and performance loss rates ) published for SHJ modules.

The growth of the SHJ technology requires confidence from manufacturers, investors, and system developers about its reliability and long-term performance. The high-efficiency silicon heterojunction (SHJ) technology is now perceived mature enough to enter the Giga-Watt manufacturing scale with several players around the globe.

Reliability test in research